This inventor holds 2 USPTO granted patents. Top assignee: Carl Zeiss Microscopy Gmbh. Active years: 2016-2018.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Location History:
- Linton Cambridge, GB (2016)
- Linton, GB (2018)
Company Filing History:

Years Active: 2016-2018
Title: The Innovative Contributions of David Roddom
Introduction
David Roddom is a notable inventor based in Linton, GB. He has made significant contributions to the field of microscopy, particularly through his innovative methods for operating charged particle microscopes. With a total of 2 patents to his name, Roddom's work has advanced the capabilities of imaging technologies.
Latest Patents
Roddom's latest patents include a method of operating a charged particle microscope. This method involves providing settings for focus, x-stigmator, and y-stigmator of the microscope. The process includes repeatedly adjusting the microscope to these settings, recording images of objects, and determining a sharpness measure from the recorded images. The sharpness measure is derived from analyzing the orientation of intensity gradients at various locations within the recorded and processed images. This innovative approach enhances the precision and effectiveness of charged particle microscopy.
Career Highlights
David Roddom is currently employed at Carl Zeiss Microscopy GmbH, a leading company in the field of microscopy. His work at this esteemed organization has allowed him to collaborate with other talented professionals and contribute to groundbreaking advancements in microscopy technology.
Collaborations
Some of Roddom's coworkers include Simon Diemer and Janina Schulz. Their collaborative efforts have further enriched the research and development environment at Carl Zeiss Microscopy GmbH.
Conclusion
David Roddom's contributions to the field of microscopy through his innovative patents and collaborative work exemplify the impact of dedicated inventors in advancing technology. His methods for operating charged particle microscopes are a testament to his expertise and commitment to innovation.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile