David Prentice

Title: David Prentice and Microscopy Sample Preparation

Introduction

David Prentice is an inventor associated with Hillsboro, Oregon, and FEI Company, now commonly known as FEI. His patent work addresses methods and systems for preparing samples for microscopy.

Latest Patents

Prentice is associated with 1 patent, titled “Microscopy Sample Preparation Methods and Associated Systems.” The patent describes methods for evaluating possible processing axes and selecting a preferred axis based on projected sample-characterization values. It also outlines extracting a specimen, imaging it, choosing a preferred tilt angle, rotating the specimen to that orientation, and processing it into a lamella. A representative system combines a focused ion beam, sample holder, stage, and controller to position the specimen so the ion beam approaches along the preferred processing axis.

Career Highlights

Prentice’s documented invention focuses on improving the selection and control of specimen orientation during microscopy sample preparation. The described techniques connect sample imaging and characterization with automated stage movement and focused-ion-beam processing.

Collaborations

Petra Binknerová and Dennis Vymer are identified as Prentice’s coworkers. The available information does not specify their roles in the patent or the invention.

Conclusion

David Prentice’s patent work at FEI Company centers on selecting specimen orientations and coordinating focused-ion-beam processing to prepare microscopy samples.