This inventor holds 1 USPTO granted patent. Top assignee: Lsi Corporation. Active years: 2009.
Company Filing History:
Years Active: 2009
Title: The Innovations of David Mark Brantley
Introduction
David Mark Brantley is an accomplished inventor based in Flower Mound, TX (US). He has made significant contributions to the field of integrated circuit technology. His work focuses on enhancing the testing capabilities of embedded systems.
Latest Patents
David holds a patent for a "Test wrapper including integrated scan chain for testing embedded hard macro in an integrated circuit chip." This invention provides an apparatus and method for testing a hard macro embedded in a system on a chip (SOC) within an integrated circuit chip. The SOC includes the hard macro, and the logic design and operation of the hard macro are unknown. The test wrapper is embedded in the SOC and includes a scan chain that surrounds the inputs and outputs of the hard macro. It receives a known test data pattern in the scan chain when in test mode, allowing the hard macro to generate outputs in response to the inputs. This innovation significantly improves the testing process for integrated circuits.
Career Highlights
David is currently employed at LSI Corporation, where he continues to develop innovative solutions in the field of integrated circuits. His expertise in testing methodologies has made him a valuable asset to his team.
Collaborations
David has collaborated with notable colleagues, including Mark Allen Boike and Seshagiri Prasad Kalluri. These partnerships have fostered a creative environment that encourages innovation and problem-solving.
Conclusion
David Mark Brantley exemplifies the spirit of innovation in the field of integrated circuits. His contributions, particularly in testing methodologies, have the potential to advance technology significantly.