David K Balkin

Title: David K. Balkin: Innovator in Cache Testing and Electrical Interconnections

Introduction

David K. Balkin is a notable inventor based in Mishawaka, IN (US). He has made significant contributions to the field of technology, particularly in cache testing and electrical interconnections. With a total of 2 patents, his work has had a meaningful impact on the industry.

Latest Patents

One of Balkin's latest patents is titled "Soft fuses using BIST for cache self-test." This innovative method involves cache testing and fault correction that occurs after wafer dicing. The process shifts cache testing from the wafer level to the built-in self-test (BIST) at the machine level. The BIST is employed alongside cache redundancy for effective fault correction. Upon power-up, the processor initiates a cache line test using BIST. When powered up, and with the test mode pins set for the array test, the array BIST test commences. The BIST traverses the array, testing each word line for hardware faults. If a fault is detected, the current address is stored in one of the N fault address registers within the processor. These registers are crucial for addressing redundant cache lines, effectively acting as 'soft' fuses. The entire cache structure is examined in this manner, with any line fault addresses being recorded. If the number of detected faults is less than the number of redundant fault lines, the processor self-test continues. However, if the faults exceed the maximum number N of redundant fault registers, an error condition is communicated to a set of pins or registers, preventing the cache from being enabled.

Another significant patent by Balkin is related to "Electrical and/or thermal interconnections and methods for obtaining such." This patent describes circuit boards or cards that feature metallic layers on opposite major surfaces of a dielectric substrate. The invention provides electrical and/or thermal interconnection between the metallic layers through vias that extend through one of the metallic layers, the dielectric substrate, and into the other metallic layer.

Career Highlights

David K. Balkin is currently associated with International Business Machines Corporation (IBM), where he continues to innovate and contribute to advancements in technology. His work has been instrumental in enhancing the efficiency and reliability of electronic systems.

Collaborations

Balkin has collaborated with notable coworkers, including Robert Maurice Houle and Kenneth Torino. Their combined expertise