David Joseph Harper

Title: David Joseph Harper: Innovator in Optical Measurements

Introduction

David Joseph Harper is a notable inventor based in Ames, IA (US). He has made significant contributions to the field of optical measurements, showcasing his expertise through his innovative patent.

Latest Patents

Harper holds a patent for optical measurements, which includes methods, apparatus, devices, subsystems, and systems designed for precise measurement of various geometrical elements. His invention allows for the accurate measurement of angles, refractive indices, and surface roughness. The method involves illuminating light on an object with distinct surfaces, capturing the interference pattern of reflected light beams, and determining angles through Fourier transform analysis.

Career Highlights

David Joseph Harper is associated with Pacific Light & Hologram, Inc., where he applies his knowledge and skills in optical technologies. His work has contributed to advancements in measurement techniques that are crucial for various applications.

Collaborations

Harper collaborates with talented individuals such as Kamran Qaderi and Jonathan Seamus Blackley, enhancing the innovative environment at his workplace.

Conclusion

David Joseph Harper's contributions to optical measurements exemplify the impact of innovation in technology. His patent reflects a commitment to advancing measurement techniques, making him a valuable figure in his field.