The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 21, 2025
Filed:
Dec. 02, 2024
Pacific Light & Hologram, Inc., San Gabriel, CA (US);
Kamran Qaderi, San Gabriel, CA (US);
David Joseph Harper, Ames, IA (US);
Jonathan Seamus Blackley, South Pasadena, CA (US);
Pacific Light & Hologram, Inc., San Gabriel, CA (US);
Abstract
Methods, apparatus, devices, subsystems, and systems for optical measurements are provided, e.g., precise measurement of a geometry of an element such as an angle of an object, a refractive index of a substance, or surface roughness of an uneven surface. In one aspect, a method includes: illuminating light on an object having a first surface extending along a first direction and a second surface extending along a second direction different from the first direction, capturing an interference pattern between a first light beam reflected from the first surface and a second light beam reflected from the second surface, and determining an angle between the first direction and the second direction based on a result of Fourier transform of the captured interference pattern.