David James Crain

Title: David James Crain - Innovator in Optical Detection Technologies

Introduction

David James Crain is a talented inventor based in Grabill, Indiana, renowned for his contributions to optical detection technologies. With a total of three patents to his name, Crain focuses on innovative methods to measure scene inhomogeneity, an essential aspect of optical system design and functionality.

Latest Patents

Crain's latest patents showcase his expertise in utilizing fixed-frequency oscillation techniques for measuring scene inhomogeneity. One of his inventions includes an optical system that employs a mirror to receive radiance from a field-of-view (FOV) of a scene. The system reflects a portion of this radiance to an optical detector, while a controller enables adjustments to the FOV. The optical detector computes a signal representing the reflected radiance, and a processor analyzes the signal’s amplitude to determine scene inhomogeneity. The controller is also designed to modulate the FOV at periodic intervals using various waveforms such as sinusoidal, pulse code modulated, or pseudo-random.

Another significant patent involves using a dispersive spectrometer to measure scene inhomogeneity. This method directs the radiance of a scene into the spectrometer, while adjusting the FOV throughout the process. Following the collection of radiance data, the method processes the signal to measure its amplitude, allowing for the determination of scene inhomogeneity. The process may include uniformly oscillating the FOV, resulting in a sinusoidal signal that enhances measurement accuracy.

Career Highlights

Throughout his career, David James Crain has made significant strides in the field of optical detection, demonstrating his innovative approach to problem-solving. His work has garnered recognition within the industry, contributing to advancements that improve optical system reliability and performance.

Collaborations

Crain works at Itt Manufacturing Enterprises, Inc. and often collaborates with notable coworkers such as Douglas Lent Cohen and Richard J. Hertel. Together, they contribute to the development of cutting-edge technologies that push the boundaries of optical measurement systems.

Conclusion

David James Crain’s commitment to innovation in optical detection technologies exemplifies the spirit of invention. His patents reflect a deep understanding of the complexities involved in measuring scene inhomogeneity and highlight his significant contributions to the field. As technology evolves, inventors like Crain continue to pave the way for advancements that have a lasting impact on industries reliant on precise optical measurements.