The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2008
Filed:
Jun. 23, 2005
Douglas Lent Cohen, Fort Wayne, IN (US);
David James Crain, Grabill, IN (US);
Richard James Hertel, Fort Wayne, IN (US);
Douglas Lent Cohen, Fort Wayne, IN (US);
David James Crain, Grabill, IN (US);
Richard James Hertel, Fort Wayne, IN (US);
ITT Manufacturing Enterprises, Inc., Wilmington, DE (US);
Abstract
A method for measuring scene inhomogeneity includes the steps of directing radiance of a scene into a dispersive spectrometer, and changing the field-of-view (FOV) of the spectrometer, while directing the radiance of the scene into the spectrometer. The method then processes the radiance of the scene to obtain a signal. The method also includes measuring an amplitude of the signal and determining scene inhomogeneity based on the measured amplitude of the signal. The method may include uniformly oscillating the FOV of the spectrometer and, next, obtaining a sinusoidal signal, based on uniformly oscillating the FOV of the spectrometer.