Cary, NC, United States of America

David Hoff

This inventor holds 1 USPTO granted patent. Top assignee: Ampere Computing LLC. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David Hoff. Retrieved from https://idiyas.com/inventor/david-hoff-1opo2jx0

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: David Hoff - Innovator in Memory Testing Technology

Introduction

David Hoff is a notable inventor based in Cary, NC (US). He has made significant contributions to the field of memory technology, particularly in the area of testing methodologies for random access memory (RAM) arrays. His innovative approach has paved the way for advancements in memory testing processes.

Latest Patents

David Hoff holds a patent for "Virtualized scan chain testing in a random access memory (RAM) array." This patent discloses methods and computer-readable media that facilitate virtualized scan chain testing. The memory array includes an integrated test circuit that allows it to behave as a serialized scan chain. This integrated test circuit enables serialized write and read access to offset entries in the memory array during each scan cycle based on received serialized test data. After the number of scan cycles matches the number of entries in the memory array, the entries are fully initialized with test data from the serial test data flow. In subsequent scan cycles, the integrated test circuit performs serial read operations to shift out stored serial test data as an output serial data flow, which can then be compared to the original serial test data.

Career Highlights

David Hoff is currently employed at Ampere Computing LLC, where he continues to innovate in the field of memory technology. His work focuses on enhancing the efficiency and effectiveness of memory testing processes, contributing to the overall advancement of computer technology.

Collaborations

Some of his notable coworkers include Yeshwant Kolla and Rahul Nadkarni. Their collaborative efforts contribute to the innovative environment at Ampere Computing LLC.

Conclusion

David Hoff's contributions to memory testing technology exemplify the impact of innovative thinking in the tech industry. His patent on virtualized scan chain testing represents a significant advancement in the field, showcasing his expertise and dedication to improving memory technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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