This inventor holds 1 USPTO granted patent. Top assignee: Ampere Computing LLC. Active years: 2024.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2024
Title: David Hoff - Innovator in Memory Testing Technology
Introduction
David Hoff is a notable inventor based in Cary, NC (US). He has made significant contributions to the field of memory technology, particularly in the area of testing methodologies for random access memory (RAM) arrays. His innovative approach has paved the way for advancements in memory testing processes.
Latest Patents
David Hoff holds a patent for "Virtualized scan chain testing in a random access memory (RAM) array." This patent discloses methods and computer-readable media that facilitate virtualized scan chain testing. The memory array includes an integrated test circuit that allows it to behave as a serialized scan chain. This integrated test circuit enables serialized write and read access to offset entries in the memory array during each scan cycle based on received serialized test data. After the number of scan cycles matches the number of entries in the memory array, the entries are fully initialized with test data from the serial test data flow. In subsequent scan cycles, the integrated test circuit performs serial read operations to shift out stored serial test data as an output serial data flow, which can then be compared to the original serial test data.
Career Highlights
David Hoff is currently employed at Ampere Computing LLC, where he continues to innovate in the field of memory technology. His work focuses on enhancing the efficiency and effectiveness of memory testing processes, contributing to the overall advancement of computer technology.
Collaborations
Some of his notable coworkers include Yeshwant Kolla and Rahul Nadkarni. Their collaborative efforts contribute to the innovative environment at Ampere Computing LLC.
Conclusion
David Hoff's contributions to memory testing technology exemplify the impact of innovative thinking in the tech industry. His patent on virtualized scan chain testing represents a significant advancement in the field, showcasing his expertise and dedication to improving memory technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
