Company Filing History:
Years Active: 2005
Title: The Innovations of David Hale
Introduction
David Hale is a notable inventor based in Santa Barbara, California. He has made significant contributions to the field of atomic force microscopy. His work has led to advancements that enhance the capabilities of light beam detecting systems.
Latest Patents
David Hale holds a patent for a "Measurement head for atomic force microscopy and other applications." This invention represents an improvement for atomic force microscopes and is also applicable to scanning probe microscopes. The patent introduces several novel features, including the use of different objective lens regions for incident and reflected light. Additionally, it incorporates a flexure that allows three-dimensional motion of the optics block. The design also features a composite material or ceramic housing and optics block, ensuring that the beam never hits a flat surface at normal incidence. Furthermore, it provides a resonant frequency of cantilever vibration greater than 850 Hz between the cantilever and sample, as well as between the cantilever and focusing lens. David Hale has 1 patent to his name.
Career Highlights
David Hale is affiliated with the University of California, where he continues to contribute to research and innovation in his field. His work has garnered attention for its practical applications and improvements in microscopy technology.
Collaborations
Throughout his career, David has collaborated with esteemed colleagues such as Paul K. Hansma and Barney Drake. These partnerships have further enriched his research and development efforts.
Conclusion
David Hale's contributions to atomic force microscopy exemplify the spirit of innovation in scientific research. His patented inventions continue to influence the field and enhance the capabilities of microscopy technologies.
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