The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2005
Filed:
Jul. 17, 2002
Paul K. Hansma, Isla Vista, CA (US);
Barney Drake, Reno, NV (US);
James Thompson, Ithaca, NY (US);
Johannes H. Kindt, Santa Barabara, CA (US);
David Hale, Santa Barbara, CA (US);
Paul K. Hansma, Isla Vista, CA (US);
Barney Drake, Reno, NV (US);
James Thompson, Ithaca, NY (US);
Johannes H. Kindt, Santa Barabara, CA (US);
David Hale, Santa Barbara, CA (US);
The Regents of the University of California, Oakland, CA (US);
Abstract
An improvement for atomic force microscopes, more generally for light beam detecting systems, but also in part applicable to scanning probe microscopes, providing significant novel features and advantages. Particular features include using different objective lens regions for incident and reflected light, a flexure that allows three dimensional motion of the optics block, forming the housing and optics block of a composite material or ceramic, arranging the components so that the beam never hits a flat surface at normal incidence, and providing a resonant frequency of cantilever vibration greater than 850 HZ between the cantilever and sample and the cantilever and focusing lens.