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For the Inventor, By the Inventor

Chanhassen, MN, United States of America

David E Fulkerson

This inventor holds 31 USPTO granted patents and 1 EPO patent, primarily in Magnetic Random Access Memory. Top assignees: Honeywell International Inc., Honeywell G.m.b.h., Micron Technology Incorporated. Active years: 1976-2008.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David E Fulkerson. Retrieved from https://idiyas.com/inventor/david-e-fulkerson

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 31

% Patents Active = 93.5


Average Co-Inventor Count = 1.1

ph-index = 10

Forward Citations = 252(Granted Patents)


Location History:

  • Minnetoaka, MN (US) (1987)
  • Minnetonka, MN (US) (1976 - 1999)
  • Chanhasen, MN (US) (2001 - 2002)
  • Plymouth, MN (US) (2004 - 2006)
  • Chanhassen, MN (US) (2001 - 2008)

Company Filing History:

goldMedal14 out of 16,049 
 
Honeywell International Inc.
 patents
silverMedal11 out of 3,646 
 
Honeywell G.m.b.h.
 patents
bronzeMedal3 out of 39,222 
 
Micron Technology Incorporated
 patents
4. 1 out of 690 
 
Honeywell Information Systems Inc.
 patents
5. 2 out of 834,513 
Other
 patents

Years Active: 1976-2008

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Areas of Expertise:
Clocked Latch
Single Event Effects
Redundancy Circuits
Low Power Signaling
CMOS Output Circuit
Threshold Voltage Control
High Speed Logic
Non-Volatile Storage
Position Sensor
Electromagnetic Radiation
Reference Voltage Regulator
Logic Gates
31 patents (USPTO):Explore Patents
1. 7411411 - Methods and systems for hardening a clocked latch against single event effects (2008-08-12),
2. 7236919 - Method for using layout regions to predict single-event effects (2007-06-26),
3. 7236001 - Redundancy circuits hardened against single event upsets (2007-06-26),
4. 7187710 - Low power pulse signaling (2007-03-06),
5. 6985382 - Bridge-type magnetic random access memory (MRAM) latch (2006-01-10),
6. 6906388 - SEU hard majority voter for triple redundancy (2005-06-14),
7. 6865106 - Bridge-type magnetic random access memory (MRAM) latch (2005-03-08),
8. 6794925 - Cold spare circuit for CMOS output circuit (2004-09-21),
9. 6731157 - Adaptive threshold voltage control with positive body bias for N and P-channel transistors (2004-05-04),
10. 6714441 - Bridge-type magnetic random access memory (MRAM) latch (2004-03-30),
11. 6667520 - SEU hard majority voter for triple redundancy (2003-12-23),
12. 6646470 - High speed output buffers using voltage followers (2003-11-11),
13. 6563356 - Flip-flop with transmission gate in master latch (2003-05-13),
14. 6563342 - CMOS ECL output buffer (2003-05-13),
15. 6535017 - CMOS ECL input buffer (2003-03-18),

Title: David E Fulkerson: A Innovator in Circuit Design

Introduction

David E Fulkerson is an accomplished inventor based in Chanhassen, MN, with an impressive portfolio of 31 patents. His work primarily focuses on enhancing the reliability and performance of circuit designs, demonstrating a strong commitment to innovation in the field of electronics.

Latest Patents

Among his latest patents, Fulkerson has developed methods and systems for hardening a clocked latch against single event effects. This invention includes a sophisticated arrangement of gates and circuits designed to ensure a reliable output in the presence of potential disruptions. The system features two three-input OR gates and two NAND gates, configured to reinforce the integrity of the signals it processes.

Another notable patent focuses on redundancy circuits hardened against single event upsets. This invention incorporates a decision block within the circuit design that not only protects data integrity during normal operating conditions but also effectively manages data storage. This innovation is essential for maintaining consistent performance in environments with potential electrical disturbances.

Career Highlights

Fulkerson's career includes significant contributions while working at Honeywell International Inc. and Honeywell GmbH, where he honed his skills in circuit design and system reliability. His work has consistently focused on developing cutting-edge solutions that address critical engineering challenges.

Collaborations

Throughout his career, David has collaborated with notable professionals in his field, including Yong Lu and Marvin L Geske. These partnerships have contributed to his success and have enabled the development of innovative technologies that benefit the broader electronics industry.

Conclusion

With a strong foundation in circuit design and a dedication to improving system reliability, David E Fulkerson has made significant contributions to the field of electronics. His patents not only showcase his technical expertise but also reflect his commitment to innovation, ensuring enhanced performance and reliability in electronic devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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