Holly, MI, United States of America

David D Malkan

This inventor holds 1 USPTO granted patent. Top assignee: Shear Graphics, LLC. Active years: 2008.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David D Malkan. Retrieved from https://idiyas.com/inventor/david-d-malkan-92kxytkq

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2008

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of David D Malkan

Introduction

David D Malkan is an accomplished inventor based in Holly, MI (US). He has made significant contributions to the field of non-destructive testing and imaging. His innovative approach has led to the development of a unique method that enhances the testing of objects without causing any damage.

Latest Patents

Malkan holds a patent for a method of non-destructive testing that involves directing coherent light onto an object. This method allows for the direct reception of the coherent light as it is reflected from the object. The process captures a range of digital images, enabling the calculation of differences between pixel values of these images. This results in the creation of cumulative differential images, which provide valuable insights into the object's integrity.

Career Highlights

David D Malkan is associated with Shear Graphics, LLC, where he applies his expertise in non-destructive testing. His work has been instrumental in advancing the capabilities of imaging technologies. Malkan's innovative methods have garnered attention for their effectiveness and precision in testing various materials.

Collaborations

Some of Malkan's notable coworkers include Eugene L Shaw and Forrest S Wright. Their collaborative efforts contribute to the ongoing development of advanced testing methodologies.

Conclusion

David D Malkan's contributions to non-destructive testing and imaging exemplify the spirit of innovation. His patented methods not only enhance testing accuracy but also pave the way for future advancements in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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