The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 14, 2008
Filed:
Feb. 25, 2005
Eugene L. Shaw, Lake Orion, MI (US);
Forrest S. Wright, Rochester, MI (US);
David D. Malkan, Holly, MI (US);
Eugene L. Shaw, Lake Orion, MI (US);
Forrest S. Wright, Rochester, MI (US);
David D. Malkan, Holly, MI (US);
Shear Graphics, LLC, Lake Orion, MI (US);
Abstract
A method of non-destructive testing includes non-destructively testing an object over a range of test levels, directing coherent light onto the object, directly receiving the coherent light substantially as reflected straight from the object, and capturing the reflected coherent light over the range of test levels as a plurality of digital images of the object. The method also includes calculating differences between pixel values of a plurality of pairs of digital images of the plurality of digital images, and adding the pixel value differences of the plurality of pairs of digital images to yield at least one cumulative differential image.