Fort Wayne, IN, United States of America

David Charles Jordan


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: David Charles Jordan: Innovator in Distance to Angle Metrology

Introduction

David Charles Jordan is a notable inventor based in Fort Wayne, IN (US). He has made significant contributions to the field of metrology, particularly with his innovative patent related to measuring movement of objects. His work has implications in various applications where precise measurements are crucial.

Latest Patents

David holds a patent for a Distance to Angle Metrology System (DAMS) and method. This system is designed to measure the movement of an object using a source of light that emits a beam. The object receives the beam and reflects it, while a reflective optic captures the reflected beam and redirects it at a first angle. As the object moves, the reflective optic adjusts the beam's angle, allowing the receiver to measure the movement based on the difference between the initial and adjusted angles. The system can utilize various types of optics, including cylindrical and spherical reflective optics, as well as refractive optics like plano hemispheric and meniscus types. The light source can be a laser or any collimated beam source, and the receiver may consist of a quad-cell imaging system or a focal plane array (FPA).

Career Highlights

David is currently employed at Exelis Inc., where he continues to develop and refine his innovative technologies. His work at Exelis has positioned him as a key player in advancing metrology systems.

Collaborations

David has collaborated with notable coworkers, including Donald David Gregory and Sheldon David Stokes. Their combined expertise contributes to the innovative environment at Exelis Inc.

Conclusion

David Charles Jordan's contributions to the field of metrology through his Distance to Angle Metrology System exemplify the importance of innovation in technology. His work not only enhances measurement accuracy but also paves the way for future advancements in the field.

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