The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2014
Filed:
Feb. 22, 2010
Donald David Gregory, Fort Wayne, IN (US);
Sheldon David Stokes, Fort Wayne, IN (US);
David Charles Jordan, Fort Wayne, IN (US);
Donald David Gregory, Fort Wayne, IN (US);
Sheldon David Stokes, Fort Wayne, IN (US);
David Charles Jordan, Fort Wayne, IN (US);
Exelis, Inc., McLean, VA (US);
Abstract
A system for measuring movement of an object includes a source of light for emitting a beam; an object for receiving the beam from the source and reflecting the beam; and a reflective optic for receiving the beam reflected from the object and again reflecting the beam at a first angle. The system also includes a receiver for receiving the reflected beam from the reflective optic. When the object moves in distance, the reflective optic reflects the beam at a second angle. The reflective optic may be replaced by an equivalent refractive optic(s). The receiver measures movement of the object, based on a difference between the first angle and the second angle. The reflective optic may include a cylindrical reflective optic, or a spherical reflective optic. The refractive optic(s) may include a plano hemispheric refractive optic, or a meniscus refractive optic. The receiver may include a quad-cell imaging system, or a focal plane array (FPA). The source of light may include a laser, or any collimated beam source.