David Chan

Title: The Innovative Contributions of David Chan

Introduction

David Chan is a notable inventor based in San Ramon, CA. He has made significant contributions to the field of integrated circuit testing. His work has led to advancements that enhance the efficiency and effectiveness of testing processes in electronic devices.

Latest Patents

David Chan holds a patent for a "Modular integrated circuit tester with distributed synchronization." This innovative device includes a set of tester modules designed to carry out a sequence of tests on an integrated circuit device under test (DUT). Each module is equipped with memory that stores instruction sets for configuring the module for each test. Before each test begins, a microcontroller in each module executes the instruction set to prepare the module accordingly. The microcontroller then sends a ready signal to a start logic circuit in other modules, indicating readiness to perform the test. Once all participating modules signal readiness, the start logic circuit instructs the microcontroller to commence the test. The modules execute the test while synchronizing their activities to a master clock signal. This process of configuration, signaling, and testing is repeated for each test in the sequence. David Chan's patent represents a significant advancement in modular testing technology.

Career Highlights

David Chan is currently employed at Credence Systems Corporation, where he continues to innovate in the field of electronic testing. His work has been instrumental in developing solutions that improve the reliability and speed of integrated circuit testing.

Collaborations

Throughout his career, David has collaborated with notable colleagues, including Brian J. Arkin and Garry C. Gillette. These collaborations have fostered an environment of innovation and have contributed to the success of various projects.

Conclusion

David Chan's contributions to the field of integrated circuit testing exemplify the impact of innovative thinking in technology. His patent for a modular integrated circuit tester showcases his commitment to enhancing testing processes. His work continues to influence the industry positively.