This inventor holds 1 USPTO granted patent. Top assignee: Corning Incorporated. Active years: 2007.
Company Filing History:
Years Active: 2007
Title: David C Jenne: Innovator in Substrate Inspection Technology
Introduction
David C Jenne is a notable inventor based in Hammond, NY (US). He has made significant contributions to the field of substrate inspection technology. His innovative approach has led to the development of a unique apparatus and process for detecting internal inclusions in transmissive substrates.
Latest Patents
David C Jenne holds 1 patent for his invention titled "Apparatus and process for detecting inclusions." This patent discloses a process and apparatus designed to inspect internal inclusions in internally transmissive substrates. The method involves applying a black coating to one major surface of the substrate, submerging it in a refractive index-matching fluid, and scanning it with a collimated light beam. The scattered light signals produced by the inclusions can be detected either by the human eye or by using a light detector. The use of index-matching fluid and the black coating enhances the signal-to-noise ratio of the process and apparatus. A preferred black coating is one cured from an electron beam or photo polymerizable coating composition applied to the major surface. This process is particularly suitable for inspecting internal inclusions in substrates that have considerable surface defects or contoured surfaces that hinder inspection in a gas medium.
Career Highlights
David C Jenne is associated with Corning Incorporated, a company renowned for its innovative glass and ceramics products. His work at Corning has allowed him to focus on advancing technologies that improve substrate inspection methods. His contributions have been instrumental in enhancing the quality and reliability of materials used in various applications.
Collaborations
Throughout his career, David has collaborated with several talented individuals, including Albert Roth Nieber and David R Fladd. These collaborations have fostered an environment of innovation and have led to the development of cutting-edge technologies in the field.
Conclusion
David C Jenne's work in the field of substrate inspection technology exemplifies the impact of innovative thinking on industry practices. His patent for detecting inclusions showcases his commitment to improving material quality and inspection methods. His contributions continue to influence advancements in the field.