The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 11, 2007
Filed:
May. 20, 2005
David G. Cyr, Painted Post, NY (US);
Christopher P. Daigler, Painted Post, NY (US);
David R. Fladd, Summerville, SC (US);
David C. Jenne, Hammond, NY (US);
Albert R. Nieber, Corning, NY (US);
Nikki JO Russo, Gouverneur, NY (US);
Paul J. Shustack, Elmira, NY (US);
David G. Cyr, Painted Post, NY (US);
Christopher P. Daigler, Painted Post, NY (US);
David R. Fladd, Summerville, SC (US);
David C. Jenne, Hammond, NY (US);
Albert R. Nieber, Corning, NY (US);
Nikki Jo Russo, Gouverneur, NY (US);
Paul J. Shustack, Elmira, NY (US);
Corning Incorporated, Corning, NY (US);
Abstract
Disclosed are process and apparatus for inspecting internal inclusions in internally transmissive substrates. The process involves applying a black coating to one major surface of the substrate, submerging the substrate in a refractive index-matching fluid, and scanning the substrate with a collimated light beam. The scattered light signals produced by the inclusions can be detected by the human eye or by using a light detector. By the use of index-matching fluid and the black coating, the signal-to-noise ratio of the process and apparatus are enhanced. A preferred black coating is one cured from an electron beam or photo polymerizable coating composition applied to the major surface. The process and apparatus are particularly suitable for inspecting internal inclusions in an internally transmissive substrate having considerable amount of surface defects or contoured surface that prevent it from inspection in a gas medium.