This inventor holds 1 USPTO granted patent. Top assignee: Sandia Corporation. Active years: 2000.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2000
Title: David A. Yocky: Innovator in Interferometric Synthetic Aperture Radar Technology
Introduction
David A. Yocky is a notable inventor based in Albuquerque, NM (US). He has made significant contributions to the field of interferometric synthetic aperture radar (IFSAR), a technology that has applications in both military and civilian elevation modeling. His innovative work has led to the development of a patent that enhances the capabilities of traditional radar systems.
Latest Patents
David A. Yocky holds a patent for a "Process for combining multiple passes of interferometric SAR data." This patent addresses the need for accurate elevation modeling by utilizing the phase difference between two SAR images taken from different elevation positions. By determining the angle of arrival for each pixel in the scene, this process allows for the transformation of two-dimensional location information into geographic coordinates, provided that the position and motion parameters of the antennas are known accurately. He has 1 patent to his name.
Career Highlights
David is currently employed at Sandia Corporation, where he continues to work on advancing radar technologies. His expertise in IFSAR has positioned him as a key player in the development of innovative solutions for complex elevation modeling challenges.
Collaborations
Throughout his career, David has collaborated with esteemed colleagues, including Douglas L. Bickel and William H. Hensley, Jr. These partnerships have fostered a collaborative environment that encourages the exchange of ideas and the advancement of technology.
Conclusion
David A. Yocky is a distinguished inventor whose work in interferometric synthetic aperture radar technology has made a significant impact in the field. His contributions continue to shape the future of elevation modeling and radar applications.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
