The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2000

Filed:

Aug. 03, 1998
Applicant:
Inventors:

Douglas L Bickel, Albuquerque, NM (US);

David A Yocky, Albuquerque, NM (US);

William H Hensley, Jr, Albuquerque, NM (US);

Assignee:

Sandia Corporation, Albuquerque, NM (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S / ;
U.S. Cl.
CPC ...
342 25 ; 342190 ; 342191 ; 342195 ;
Abstract

Interferometric synthetic aperture radar (IFSAR) is a promising technology for a wide variety of military and civilian elevation modeling requirements. IFSAR extends traditional two dimensional SAR processing to three dimensions by utilizing the phase difference between two SAR images taken from different elevation positions to determine an angle of arrival for each pixel in the scene. This angle, together with the two-dimensional location information in the traditional SAR image, can be transformed into geographic coordinates if the position and motion parameters of the antennas are known accurately.


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