David A Grigg

Title: David A. Grigg: Inventor in Precision Measurement

Introduction

David A. Grigg is an inventor associated with Glastonbury, Connecticut, and Zygo Corporation. His work includes inventions in interferometry and optical measurement for precision-engineered parts. His patent record includes 2 patents.

Latest Patents

**Scanning Interferometry.** This invention describes an interferometry method that forms an interference pattern by imaging light reflected from a test surface together with reference light derived from the same source. It varies the optical path length difference across a range larger than the imaging system’s depth of focus while keeping the measured portion of the surface within focus.

**Optical Systems for Measuring Form and Geometric Dimensions of Precision Engineered Parts.** This invention determines a geometric property by interferometrically profiling two surfaces in different coordinate systems, establishing the relationship between those systems, and calculating the property from the profiles and relationship. The coordinate relationship can be established using calibrated gage blocks or a displacement-measuring interferometer.

Career Highlights

Grigg’s listed inventions address optical techniques for measuring surface form and geometric dimensions. These methods support precision measurement by combining interferometric profiling with ways to manage focus and relate measurements taken in different coordinate systems.

Collaborations

Grigg is associated with Zygo Corporation. His listed coworkers include Xavier Colonna De Lega and Peter J. De Groot.

Conclusion

David A. Grigg’s patent work reflects a focus on interferometry and optical systems for measuring precision-engineered surfaces and dimensions.