Aloha, OR, United States of America

Dave F Dubberke

This inventor holds 1 USPTO granted patent. Top assignee: Intel Corporation. Active years: 2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Dave F Dubberke. Retrieved from https://idiyas.com/inventor/dave-f-dubberke

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: Innovations of Dave F Dubberke

Introduction

Dave F Dubberke is an accomplished inventor based in Aloha, Oregon. He has made significant contributions to the field of structural testing through his innovative patent. His work is particularly relevant in the context of integrated circuit testing, showcasing his expertise and creativity.

Latest Patents

Dave F Dubberke holds a patent for "Structural testing using boundary scan techniques." This patent discloses a boundary scan technique that generates toggling waveforms, such as square wave signals, to perform structural testing. The invention includes an instr_extesttoggle command that enables IEEE 1149.1 boundary scan cells to selectively generate toggling signals on specified output pads of integrated circuits. The frequency of the toggling signal can be controlled by the JTAG clock signal, allowing it to be independent of the length of the boundary scan chain. This innovative approach circumvents the need for provisioning test points on the interconnects of printed circuit boards.

Career Highlights

Dave is currently employed at Intel Corporation, where he continues to contribute to advancements in technology. His work at Intel has allowed him to apply his inventive skills in a practical setting, further enhancing the capabilities of integrated circuits.

Collaborations

Throughout his career, Dave has collaborated with notable colleagues, including Christopher J Koza and James J Grealish. These collaborations have likely enriched his work and contributed to the success of his projects.

Conclusion

Dave F Dubberke is a notable inventor whose work in structural testing has made a significant impact in the field of integrated circuits. His innovative patent demonstrates his ability to solve complex problems and improve testing methodologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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