Company Filing History:
Years Active: 2011-2014
Title: Innovations by Dave Bakker
Introduction
Dave Bakker is a notable inventor based in Cupertino, CA. He has made significant contributions to the field of substrate analysis and defect measurement. With a total of 2 patents, his work has advanced the methodologies used in these areas.
Latest Patents
Bakker's latest patents include innovative methods and systems for measuring characteristics of substrates. One of his methods involves using an electron beam to remove a portion of a feature on the substrate, exposing a cross-sectional profile for measurement. This technique is particularly useful for photoresist features. Additionally, he has developed methods for preparing substrates for analysis by removing material near defects using chemical etching combined with electron and light beams. These advancements provide valuable insights into subsurface defects and enhance the overall analysis process.
Career Highlights
Dave Bakker is currently employed at KLA-Tencor Technologies Corporation, where he continues to push the boundaries of substrate analysis technology. His work has been instrumental in improving the accuracy and efficiency of defect detection and characterization.
Collaborations
Bakker has collaborated with esteemed colleagues such as Gabor D. Toth and Varoujan Chakarian. Their combined expertise has contributed to the success of various projects within the company.
Conclusion
Dave Bakker's innovative approaches to substrate analysis and defect measurement have made a significant impact in his field. His patents reflect a commitment to advancing technology and improving methodologies in substrate characterization.