This inventor holds 1 USPTO granted patent and 4 published patent applications. Top assignee: Genentech, Inc.. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Darya Yuryevna Orlova and High-Dimensional Spatial Analysis.
Introduction
Darya Yuryevna Orlova is an inventor based in Los Altos, California, and is associated with Genentech, Inc. Her work includes a patent for analyzing spatial patterns among cells in biological samples.
Latest Patents
Orlova is credited with 1 patent, titled “High Dimensional Spatial Analysis.” The invention describes segmenting an image of a biological sample so that each segment corresponds to an individual cell, then determining the cells’ phenotypes. It identifies different cell types and uses metrics such as the colocation quotient or Earth Mover’s Distance to quantify patterns of co-occurrence between them. The method can also generate a visual representation of those patterns based on the selected metric.
Career Highlights
The patent reflects an approach to spatial analysis that combines cell segmentation, phenotype identification, quantitative measurement, and visualization. These techniques can help characterize how different cell types are distributed in relation to one another within a biological sample.
Collaborations
The provided information lists Rajiv Edillon Jesudason and Xiao Li as Orlova’s coworkers. Their shared association with Genentech, Inc. provides professional context for her work, though no specific collaboration on the patent is stated.
Conclusion
Darya Yuryevna Orlova’s patent presents a method for measuring and visualizing relationships between cell types, highlighting her contribution to high-dimensional spatial analysis of biological samples.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile