The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2026
Filed:
Oct. 20, 2023
Genentech, Inc., South San Francisco, CA (US);
Xiao Li, Foster City, CA (US);
Darya Yuryevna Orlova, Los Altos, CA (US);
Joaquin Pechuan Jorge, San Francisco, CA (US);
Rajiv Edillon Jesudason, Oakland, CA (US);
GENENTECH, INC., South San Francisco, CA (US);
Abstract
A method for high dimensional spatial analysis includes segmenting, into a plurality of segments, an image depicting a plurality of cells comprising a biological sample. Each segment of the plurality of segments may correspond to one cell of the plurality of cells. A phenotype for each cell of the plurality of cells depicted in the image may be determined based on the segmented image. The determining of the phenotype may include identifying, within the plurality of cells, a first cell type having a first phenotype and a second cell type having a second phenotype. One or more metrics, such as a colocation quotient or an Earth Mover's Distance, quantifying a co-occurrence pattern between the first cell type and the second cell type may be determined. A visual representation of the co-occurrence pattern between the first cell type and the second cell type may be generated based on the metric.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile