McKinney, TX, United States of America

Darrin Green

This inventor holds 1 USPTO granted patent. Top assignee: Raytheon Company. Active years: 2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Darrin Green. Retrieved from https://idiyas.com/inventor/darrin-green

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: Darrin Green - Innovator in Microsection Sample Stabilization

Introduction

Darrin Green is an accomplished inventor based in McKinney, TX (US). He has made significant contributions to the field of microscopy through his innovative designs. His work focuses on enhancing the stability and alignment of microsection samples for microscopic inspection.

Latest Patents

Darrin Green holds a patent for a Microsection Sample Stabilizer. This device is designed to align and stabilize microsection samples, ensuring they are properly positioned for microscopic examination. The stabilizer features a frame with a base and at least one leveling portion that defines a viewing window for the microscope. It includes a compliant device that supports the microsection sample and biases it against the leveling portion, allowing for a clear examination plane surface.

Career Highlights

Darrin Green is currently employed at Raytheon Company, where he applies his expertise in engineering and innovation. His work at Raytheon has allowed him to collaborate with other talented professionals in the field.

Collaborations

Some of Darrin's notable coworkers include Stephen T. Fasolino and Joseph F. Colangelo. Their combined efforts contribute to the advancement of technology and innovation within their projects.

Conclusion

Darrin Green's contributions to the field of microscopy through his Microsection Sample Stabilizer exemplify his commitment to innovation. His work continues to impact the way microsection samples are examined, enhancing the accuracy and efficiency of microscopic inspections.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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