The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 28, 2022
Filed:
Feb. 20, 2019
Raytheon Company, Waltham, MA (US);
Darrin Green, McKinney, TX (US);
Stephen T. Fasolino, McKinney, TX (US);
Joseph F. Colangelo, Carrollton, TX (US);
Raytheon Company, Waltham, MA (US);
Abstract
A microsection sample stabilizer for aligning and stabilizing a microsection sample for microscopic inspection includes a frame including a base and at least one leveling portion supported by the base. The at least one leveling portion can define a viewing window for a microscope. The microsection sample stabilizer includes an interior region within the frame, and at least one compliant device operable within the interior region of the frame and operable to be supported by the base. The compliant device receives and supports the microsection sample, and biases the microsection sample against the at least one leveling portion of the frame to stabilize the microsection sample, such that an examination plane surface of the microsection sample is aligned and viewable through the viewing window by the microscope.