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Title: Dario Cattozzo Mor: Innovator in Optical Field Sampling Technology
Introduction
Dario Cattozzo Mor is a prominent inventor based in Desenzano del Garda, Italy. He has made significant contributions to the field of optoelectronics, particularly in the area of integrated optical field sampling platforms. His innovative work has the potential to revolutionize how we sample and analyze low-energy, near-infrared waveforms.
Latest Patents
Dario holds a patent for an "Integrated Optical Field Sampling Platform." This patent describes an all-on-chip, optoelectronic device designed for sampling arbitrary, low-energy, near-infrared waveforms under ambient conditions. The solid-state integrated detector utilizes optical-field-driven electron emission from resonant nanoantennas, achieving petahertz-level switching speeds by generating on-chip attosecond electron bursts. Additionally, the patent discloses a cross-correlation technique based on perturbation of local electron field emission rates, allowing for the full characterization of arbitrary electric fields down to 1 femtojoule, and/or on the order of 500 kV/m, using plasmonic nanoantennas.
Career Highlights
Dario has worked at prestigious institutions such as the Massachusetts Institute of Technology and the University of California. His experience in these renowned organizations has greatly influenced his research and development in optoelectronic technologies.
Collaborations
Dario has collaborated with notable colleagues, including Marco Turchetti and Mina Bionta. Their joint efforts have contributed to advancements in the field and have fostered a collaborative environment for innovation.
Conclusion
Dario Cattozzo Mor is a key figure in the development of advanced optical technologies. His patent and work at leading research institutions highlight his commitment to innovation in the field of optoelectronics.