Company Filing History:
Years Active: 1977-2002
Title: The Innovations of Daniel W. Micek
Introduction
Daniel W. Micek is an accomplished inventor based in Norridge, Illinois. He holds four patents that showcase his expertise in the field of ultrasonic inspection and automated imaging systems. His innovative contributions have significantly advanced the technology used in electronic component inspection.
Latest Patents
One of Micek's latest patents is the "Automated Acoustic Micro Imaging System and Method." This system features a part-storage station designed to maintain a dry environment, a part-transport robot, and a wet-environment inspection station. The inspection station utilizes an ultrasonic beam generator and a coupling fluid for inspecting parts, ensuring that a moisture barrier separates the dry and wet environments. Additionally, the system includes a kinematic, quick-change part-retaining chuck and robotic means for interchanging chucks.
Another notable patent is the "Method and Apparatus for Ultrasonic Inspection of Electronic Components." This invention provides a non-destructive ultrasonic inspection method where multiple integrated circuits or electronic components are arranged on a liquid-permeable tray. These components are scanned by an ultrasonic beam in a scanning station, allowing for the detection of any anomalies. The tray is air-dried after the inspection, ensuring the integrity of the components.
Career Highlights
Micek has worked with several prominent companies, including Sonoscan, Inc. and Universal Research Laboratories, Inc. His experience in these organizations has contributed to his development of innovative inspection technologies.
Collaborations
Throughout his career, Micek has collaborated with notable professionals, including Lawrence W. Kessler and John Billone. These partnerships have fostered a creative environment that has led to significant advancements in ultrasonic inspection methods.
Conclusion
Daniel W. Micek's contributions to the field of ultrasonic inspection and automated imaging systems highlight his innovative spirit and technical expertise. His patents reflect a commitment to improving the quality and efficiency of electronic component inspection.