The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 1997

Filed:

Jul. 15, 1996
Applicant:
Inventors:

Lawrence W Kessler, Buffalo Grove, IL (US);

Daniel W Micek, Norridge, IL (US);

John Billone, Des Plaines, IL (US);

Assignee:

Sonoscan, Inc., Bensenville, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73618 ; 73620 ;
Abstract

A method and apparatus for non-destructive ultrasonic inspection in which a plurality of integrated circuits or other electronic components laid out in a fixed pattern on a liquid-permeable tray are moved along an inspection path through a scanning station. In the scanning station the electronic components are repetitively scanned by an ultrasonic beam from a transmitter/receiver moving rapidly back and forth across the inspection path; an ultrasonic coupling liquid (usually water) continuously flows along the beam path; the coupling liquid also flows along the surfaces of the electronic components opposite the beam path. The tray of electronic components is air dried as it emerges from the scanning station. Both reflected and 'through' ultrasonic signals can be collected to disclose any anomalies present in the electronic components. A screen may be used to assure retention of the electronic components in the desired pattern on a tray.


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