New York, NY, United States of America

Daniel Lu

This inventor holds 1 USPTO granted patent. Top assignee: New York University. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Daniel Lu. Retrieved from https://idiyas.com/inventor/daniel-lu-urjcjpx4

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Innovations by Daniel Lu in Robotic Inspection Technology

Introduction

Daniel Lu is an accomplished inventor based in New York, NY (US). He has made significant contributions to the field of robotic inspection technology. His innovative approach combines advanced sensor technology with machine learning to enhance structural inspections.

Latest Patents

Daniel Lu holds a patent for a "System and method for robotic inspection." This inspection system utilizes a ground penetrating radar (GPR) sensor to provide probe signals to a structure and receive return signals. The processor in the system analyzes these signals to generate various data types, including maximum amplitude trace normalized data and power spectral density images. The machine learning processor is trained to identify anomalies of interest, making inspections more efficient and accurate. He has 1 patent to his name.

Career Highlights

Daniel Lu is affiliated with New York University, where he continues to push the boundaries of innovation in robotic inspection. His work has garnered attention for its practical applications in ensuring the safety and integrity of structures.

Collaborations

Some of his notable coworkers include Chen Feng and Semiha Ergan, who contribute to the collaborative environment that fosters innovation at New York University.

Conclusion

Daniel Lu's work in robotic inspection technology exemplifies the intersection of engineering and artificial intelligence. His contributions are paving the way for safer and more efficient inspection methods in various industries.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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