The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2026

Filed:

Aug. 21, 2023
Applicant:

New York University, New York, NY (US);

Inventors:

Chen Feng, New York, NY (US);

Semiha Ergan, New York, NY (US);

Bilal Sher, New York, NY (US);

Xuchu Xu, New York, NY (US);

Guanbo Chen, New York, NY (US);

Talha Javed, New York, NY (US);

Sruti Madhusudhan, New York, NY (US);

Siddharth Mahesh, New York, NY (US);

Aravindan Vasudevan, New York, NY (US);

Daniel Lu, New York, NY (US);

Beyza Kiper, New York, NY (US);

Assignee:

New York University, New York, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 7/41 (2006.01); G01S 13/88 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G01S 7/412 (2013.01); G01S 7/417 (2013.01); G01S 13/885 (2013.01); G06T 7/0002 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract

An inspection system includes a ground penetrating radar (GPR) sensor configured to provide at least one probe signal to a portion of a structure and to receive at least one return signal resulting from the corresponding at least one probe signal. A processor is programmed to: receive the at least one return signal as scan data from the GPR sensor; generate maximum amplitude trace normalized data based on the scan data; generate temporal signal gain data based on the scan data; generate a power spectral density image for each of the scan data, the maximum amplitude trace normalized data, and the temporal signal gain data; and analyze, using a machine learning processor, the power spectral density images to identify an anomaly of interest, wherein the machine learning processor is trained to detect an anomaly of interest based on a training set of power spectral density images.


Find Patent Forward Citations

Feng, Chen. (2026). System and method for robotic inspection (U.S. Patent No. 12591041). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12591041

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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