Waltham, MA, United States of America

Daniel Harari

This inventor holds 1 USPTO granted patent. Top assignee: Teradyne, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Daniel Harari. Retrieved from https://idiyas.com/inventor/daniel-harari-rg4hmngj

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Daniel Harari: Circuit-Board Testing Inventor.

Introduction

Daniel Harari is an inventor associated with Waltham, Massachusetts, and Teradyne, Inc. His patent work addresses testing electrical connections in circuit boards.

Latest Patents

Harari is credited with 1 patent, titled “Testing a Circuit Board.” The disclosed system applies an electrical signal to a conductive structure on a circuit board using a pin assembly. A sensor wirelessly couples to another conductive structure and receives an electrical response carried through a circuit-board trace. This approach is designed to test electrical connections without requiring direct physical contact between the sensor and the structure being monitored.

Career Highlights

Harari’s listed invention focuses on circuit-board testing, combining a physical electrical contact for signal application with wireless sensing to detect the resulting response. He is associated with Teradyne, Inc., a company known for test and automation technologies.

Collaborations

Harari’s listed coworkers include Timothy Cunningham and Anthony Suto. Their inclusion indicates professional connections, though the supplied information does not specify their roles in the patent or any joint work.

Conclusion

Daniel Harari’s patent describes a circuit-board testing system that uses wireless sensing to evaluate electrical responses, reflecting his documented work in electronic testing technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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