This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Mettler-Toledo Ag. Active years: 2009.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2009
Title: The Innovative Contributions of Daniel Aepli
Introduction
Daniel Aepli is a notable inventor based in Dübendorf, Switzerland. He has made significant contributions to the field of force measurement technology. His innovative approach has led to the development of a unique patent that enhances the reliability and longevity of force-measuring devices.
Latest Patents
Daniel Aepli holds a patent for a "Method of monitoring and/or determining the condition of a force-measuring device, and force-measuring device." This invention involves a method for monitoring the condition of a force-measuring device that includes a housing with an interior space and at least one force-measuring cell. The method measures at least one parameter of the atmospheric climate within the housing, which influences the operating lifetime of the force-measuring cell. The sensor signal corresponding to the measured parameter is transmitted to a computing unit or data output device, ensuring accurate monitoring.
Career Highlights
Daniel Aepli is associated with Mettler-Toledo AG, a leading company in precision measurement technology. His work at Mettler-Toledo AG has allowed him to apply his innovative ideas in a practical setting, contributing to advancements in measurement solutions.
Collaborations
Throughout his career, Daniel has collaborated with esteemed colleagues such as Jean-Maurice Tellenbach and Helmut Bäumel. These collaborations have fostered an environment of innovation and creativity, leading to the development of cutting-edge technologies in the field.
Conclusion
Daniel Aepli's contributions to the field of force measurement technology exemplify the impact of innovative thinking in engineering. His patent and work at Mettler-Toledo AG highlight the importance of monitoring and improving the reliability of measurement devices.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
