The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2009
Filed:
Nov. 14, 2006
Jean-maurice Tellenbach, Hettlingen, CH;
Daniel Aepli, Dübendorf, CH;
Helmut Bäumel, Greifensee, CH;
Jean-Maurice Tellenbach, Hettlingen, CH;
Daniel Aepli, Dübendorf, CH;
Helmut Bäumel, Greifensee, CH;
Mettler-Toledo AG, Greifensee, CH;
Abstract
In a method for monitoring and/or determining the condition of a force-measuring device with at least one housing that has an interior space and with at least one force-measuring cell installed in the interior space of the at least one housing, at least one parameter of the atmospheric climate of the interior space is measured with at least one sensor that is arranged in the interior space of the housing or with at least one sensor that is arranged at the housing, wherein said parameter is of a kind that has an influence on the operating lifetime of the force-measuring cell; and a sensor signal corresponding to the measured parameter of the atmospheric climate of the interior space is transmitted to a computing unit and/or to a data output device.