Minneapolis, MN, United States of America

Dan Sikorski

This inventor holds 1 USPTO granted patent. Top assignee: Xcerra Corporation. Active years: 2018.


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Dan Sikorski

Introduction

Dan Sikorski is a notable inventor based in Minneapolis, MN (US). He has made significant contributions to the field of microchip testing through his innovative designs. His work focuses on enhancing the reliability and efficiency of testing apparatuses used in the semiconductor industry.

Latest Patents

Dan Sikorski holds a patent for a "Link socket sliding mount with preload." This invention is a test socket that utilizes a link and mount system to couple a device under test (DUT) to a testing apparatus. The design allows for quick and reliable testing of microchips post-production. The socket features a pivoting link that connects to the DUT, an elastomer for biasing the link in a preferred orientation, and a mount that acts as a fulcrum to engage the DUT. The innovative design eliminates fixed arrangements and non-compliant loads, ensuring successful contact with test equipment without damaging it.

Career Highlights

Dan Sikorski is currently employed at Xcerra Corporation, where he continues to develop cutting-edge solutions for the semiconductor testing industry. His work has been instrumental in advancing testing methodologies and improving the overall quality of microchip production.

Collaborations

Dan has collaborated with talented individuals such as Aaron Magnuson and Sergey Yakushev. Their combined expertise has contributed to the successful development of innovative testing solutions.

Conclusion

Dan Sikorski's contributions to the field of microchip testing exemplify the importance of innovation in technology. His patented designs and collaborative efforts continue to shape the future of semiconductor testing.

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