Company Filing History:
Years Active: 2006-2007
Title: The Innovations of Dan Prager
Introduction
Dan Prager is an accomplished inventor based in Hopewell Junction, NY (US). He has made significant contributions to the field of optical metrology, holding a total of 2 patents. His work focuses on optimizing process control through advanced measurement techniques.
Latest Patents
One of Dan Prager's latest patents is centered on optical metrology model optimization for process control. This invention involves evaluating the adequacy of a profile model by selecting various types of process control to manage a fabrication process. The process includes selecting profile model parameters and acceptable ranges for these parameters. Additionally, it involves choosing first and second metrology tools and establishing statistical metric criteria that define acceptable variations in measurements obtained from these tools. Measurements of the profile model parameters are then obtained using both tools, and statistical metrics are calculated based on these measurements. Finally, the calculated statistical metrics are compared to the set criteria to assess the adequacy of the selected profile model.
Career Highlights
Throughout his career, Dan Prager has worked with notable companies such as Timbre Technologies, Inc. and Tokyo Electron Limited. His experience in these organizations has contributed to his expertise in optical metrology and process control.
Collaborations
Dan has collaborated with several professionals in his field, including Jason Ferns and Lawrence Lane. These collaborations have further enriched his work and innovations.
Conclusion
Dan Prager is a notable inventor whose contributions to optical metrology and process control have made a significant impact in his field. His patents reflect his commitment to advancing technology and improving fabrication processes.