Dan Hao

Title: The Innovative Contributions of Dan Hao

Introduction

Dan Hao is a prominent inventor based in Beijing, China. He has made significant strides in the field of software engineering, particularly in defect location methodologies. His work focuses on enhancing the accuracy of defect identification in target programs, which is crucial for software development and maintenance.

Latest Patents

Dan Hao holds a patent for a "Defect location method and device based on coverage information." This innovative method involves characterizing program structure information and test case coverage information of a target program in a graph format. The process includes generating a node attribute sequence and an adjacency matrix based on the graph-characterized structure. By inputting these elements into a trained graph neural network model, the model outputs a suspicious degree list of the target program. This approach allows for the preservation of coverage information without loss and compression, while also considering structural information, thereby improving defect location accuracy.

Career Highlights

Dan Hao is affiliated with Peking University, where he contributes to research and development in software engineering. His expertise in graph-based methodologies has positioned him as a valuable asset in the academic and technological communities. His innovative approach to defect location has garnered attention and respect among peers in the field.

Collaborations

Dan Hao collaborates with notable colleagues, including Lu Zhang and Yiling Lou. Their combined efforts in research and development have further advanced the understanding and application of defect location techniques in software engineering.

Conclusion

Dan Hao's contributions to the field of software engineering, particularly through his patented defect location method, demonstrate his innovative spirit and commitment to improving software quality. His work continues to influence the industry and inspire future advancements in technology.