Madrid, Spain

Damian Siedlecki

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Consejo Superior De Investigaciones Cientificas. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Damian Siedlecki. Retrieved from https://idiyas.com/inventor/damian-siedlecki

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

 

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Damian Siedlecki: Innovator in Optical Coherence Tomography

Introduction

Damian Siedlecki is a notable inventor based in Madrid, Spain. He has made significant contributions to the field of optical coherence tomography, particularly through his innovative patent. His work focuses on enhancing the accuracy and reliability of optical imaging systems.

Latest Patents

Damian holds a patent for a "Method for calibrating and correcting the scanning distortion of an optical coherence tomography system." This method utilizes reference patterns to establish mathematical relationships between the positions of reference points and their local coordinates. The coordinates are obtained through the optical coherence tomography system, which improves the calibration process.

Career Highlights

Throughout his career, Damian has worked with esteemed organizations, including the Consejo Superior de Investigaciones Científicas. His experience in research institutions has allowed him to develop and refine his innovative techniques in optical imaging.

Collaborations

Damian has collaborated with notable colleagues such as Sergio Ortiz Egea and Susana Marcos Celestino. These partnerships have contributed to the advancement of his research and the successful implementation of his patented methods.

Conclusion

Damian Siedlecki's contributions to optical coherence tomography demonstrate his commitment to innovation in the field. His patent reflects a significant advancement in the calibration of imaging systems, showcasing his expertise and dedication to improving optical technologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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