The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 14, 2017
Filed:
Mar. 21, 2012
Applicants:
Sergio Oritz Egea, Madrid, ES;
Susana Marcos Celestino, Madrid, ES;
Damian Siedlecki, Madrid, ES;
Carlos Dorronsoro Díaz, Madrid, ES;
Inventors:
Sergio Oritz Egea, Madrid, ES;
Susana Marcos Celestino, Madrid, ES;
Damian Siedlecki, Madrid, ES;
Carlos Dorronsoro Díaz, Madrid, ES;
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 19/00 (2013.01); G01D 18/00 (2006.01); G01B 9/02 (2006.01); A61B 3/10 (2006.01); A61B 5/00 (2006.01); G06T 5/00 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G01B 9/0209 (2013.01); A61B 3/102 (2013.01); A61B 5/0066 (2013.01); G01B 9/02072 (2013.04); G01B 9/02076 (2013.01); G01B 9/02091 (2013.01); G06T 5/006 (2013.01); G06T 7/0018 (2013.01); A61B 2560/0233 (2013.01); G01B 2290/65 (2013.01); G06T 2207/10101 (2013.01);
Abstract
Method for calibrating and correcting the scanning distortion of any optical coherence tomography system by using reference patterns and obtaining mathematical relationships between the positions of the reference points in a reference pattern and the local coordinates of said reference points, said coordinates are obtained by means of said optical coherence tomography system.