Dale K Seppa

Title: The Innovations of Dale K Seppa

Introduction

Dale K Seppa is a notable inventor based in New Brighton, MN (US). She has made significant contributions to the field of embedded RAM testing and logic circuit design. With a total of 3 patents, her work has had a lasting impact on the technology industry.

Latest Patents

One of her latest patents is for a method titled "VLSI Embedded RAM Test." This invention provides a comprehensive approach to testing embedded RAM devices, ensuring that any cells with slow write recovery times can be detected. The preferred mode of this invention employs built-in self-test (BIST) techniques, utilizing a modified 5N march test sequence. This simple algorithm, implemented in programmable hardware, guarantees that the embedded RAM devices are functional and meet recovery time requirements. This method can be applied both before and after card assembly to monitor the integrity of the embedded RAM.

Another significant patent is the "Transparent Flip-Flop." This apparatus features a transparent master/slave flip-flop logic circuit that includes a single line connected to the transparency input. When this line is active, input data can pass through the flip-flop, unless the scan signal is also active, which returns the flip-flop to a clocked status.

Career Highlights

Dale has worked with prominent companies such as Unisys Corporation and Sperry Corporation. Her experience in these organizations has contributed to her expertise in the field of electronics and embedded systems.

Collaborations

Throughout her career, Dale has collaborated with notable individuals, including Larry L Byers and Donald W Mackenthun. These partnerships have further enriched her work and innovations.

Conclusion

Dale K Seppa's contributions to the field of embedded RAM testing and logic circuit design highlight her innovative spirit and technical expertise. Her patents continue to influence the technology landscape, showcasing her role as a significant inventor.