The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 1980

Filed:

Dec. 02, 1977
Applicant:
Inventor:

Dale K Seppa, New Brighton, MN (US);

Assignee:

Sperry Corporation, New York, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
364900 ; 371 38 ;
Abstract

A method of and an apparatus for distinguishing between transient and solid errors within a single-error-correcting semiconductor memory storage unit (MSU) comprised of a plurality of large scale integrated (LSI) bit planes and for notifying the associated data processing system of required maintenance action. The method utilizes an error logging store (ELS) that is comprised of a plurality of memory error registers one for each separately associated word group within the MSU. Each memory error register contains storage for: (1) the Error Correction Code (ECC) defined, failing bit position; (2) the single bit error counter; (3) the multiple single bit error tag; and (4) the multiple bit error tag. Upon detection of an error within a word group, the associated memory error register is accessed to determine the history of previously detected errors within that word group. The central processing unit (CPU) is notified by a priority interrupt of the error status of that word group if:


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