Seoul, South Korea

Dal Jo Lee


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: Dal Jo Lee - Innovator in Semiconductor Testing

Introduction

Dal Jo Lee is a prominent inventor based in Seoul, South Korea. He has made significant contributions to the field of semiconductor testing, showcasing his expertise through innovative designs and solutions. His work is particularly focused on improving the efficiency and cost-effectiveness of semiconductor test interfaces.

Latest Patents

Dal Jo Lee holds a patent for a semiconductor test interface. This invention relates to a semiconductor test interface designed for interfacing a Device Under Test (DUT) to a pin card. The interface utilizes a cable that includes a DUT board with connectors for connecting test sockets to the DUT. The design simplifies the manufacturing process, thereby reducing costs and allowing for easy adaptation to various DUTs. He has 1 patent to his name.

Career Highlights

Dal Jo Lee is currently employed at Unitest Inc., where he continues to develop innovative solutions in semiconductor testing. His work has been instrumental in advancing the technology used in this critical field. He is recognized for his ability to streamline processes and enhance the functionality of testing equipment.

Collaborations

Dal Jo Lee has collaborated with notable colleagues, including Dae Kyoung Kim and Sun Whan Kim. Their combined efforts have contributed to the success of various projects within the semiconductor testing domain.

Conclusion

Dal Jo Lee is a key figure in the semiconductor testing industry, with a focus on innovation and efficiency. His contributions, particularly through his patented semiconductor test interface, highlight his commitment to advancing technology in this field.

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