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For the Inventor, By the Inventor

Kawasaki, Japan

Daisuke Maruyama

This inventor holds 8 USPTO granted patents and 1 published patent application. Top assignee: Fujitsu Corporation. Active years: 2001-2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Daisuke Maruyama. Retrieved from https://idiyas.com/inventor/daisuke-maruyama-7nhpawga

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 8 

% Patents Active = 50.0

Average Co-Inventor Count = 1.1

ph-index = 2

Forward Citations = 32(Granted Patents)


Company Filing History:

goldMedal8 out of 39,374 
 
Fujitsu Corporation
 patents

Years Active: 2001-2023

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8 patents (USPTO):Explore Patents
1. 11693054 - Computer-readable recording medium storing analysis program, analysis method, and analysis device (2023-07-04),
2. 9772377 - Circuit division method for test pattern generation and circuit division device for test pattern generation (2017-09-26),
3. 8332715 - Test pattern generating method, device, and program (2012-12-11),
4. 7437646 - Test pattern generating method and apparatus and storing medium for storing test pattern generating program (2008-10-14),
5. 7246292 - Apparatus and method for bit pattern learning and computer product (2007-07-17),
6. 7178078 - Testing apparatus and testing method for an integrated circuit, and integrated circuit (2007-02-13),
7. 7027947 - Integrated circuit testing method, program, storing medium, and apparatus (2006-04-11),
8. 6205567 - Fault simulation method and apparatus, and storage medium storing fault simulation program (2001-03-20),

Title: Daisuke Maruyama: Innovator in Circuit Analysis and Test Pattern Generation

Introduction

Daisuke Maruyama is a prominent inventor based in Kawasaki, Japan. He has made significant contributions to the field of circuit analysis and test pattern generation. With a total of 8 patents to his name, Maruyama continues to push the boundaries of technology through his innovative ideas.

Latest Patents

Maruyama's latest patents include a computer-readable recording medium that stores an analysis program, an analysis method, and an analysis device. This invention allows a computer to execute processes such as reading circuit data, generating test data for delay faults, and analyzing potential underkill scenarios. The program also presents circuit modification locations to avoid underkill based on the analysis results. Another notable patent is a circuit division method for test pattern generation. This method involves acquiring feature amounts regarding the size and function of blocks within a target circuit, classifying these blocks into groups, and assigning them to divided circuits based on specific ratios.

Career Highlights

Daisuke Maruyama is currently employed at Fujitsu Corporation, where he applies his expertise in circuit design and analysis. His work has been instrumental in advancing the company's technological capabilities and enhancing the efficiency of circuit testing processes.

Collaborations

Maruyama collaborates with talented coworkers, including Junko Kumagai and Hideaki Konishi. Together, they contribute to innovative projects that aim to improve circuit analysis and testing methodologies.

Conclusion

Daisuke Maruyama is a key figure in the field of circuit analysis and test pattern generation. His innovative patents and contributions to Fujitsu Corporation highlight his commitment to advancing technology. His work continues to inspire future developments in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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