This inventor holds 1 USPTO granted patent and 17 published patent applications. Top assignee: Nippon Telegraph and Telephone Corporation. Active years: 2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2025
Title: Daiki Kobayashi: Inventor of a Deformation Measuring Device
Introduction
Daiki Kobayashi is an inventor based in Tokyo, Japan, associated with Nippon Telegraph and Telephone Corporation. His listed patent concerns a device and method for measuring deformation.
Latest Patents
Kobayashi is credited with 1 patent: “Deformation Measuring Device and Deformation Measuring Method.” The invention measures strain on an FEP by using a viscous body with lower rigidity than the FEP to cover its uneven surface. A strain gauge attached to part of the viscous body’s surface measures the strain.
Career Highlights
Kobayashi’s listed invention addresses the practical challenge of measuring strain on an uneven surface. The patent describes using a more compliant layer between the FEP and the strain gauge.
Collaborations
Kazuaki Watanabe and Masafumi Nakagawa are identified as Kobayashi’s coworkers. The available information does not specify their roles in the patent.
Conclusion
Daiki Kobayashi’s recorded patent focuses on a strain-measurement approach that combines a viscous covering layer with a strain gauge to measure deformation on FEP.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile