The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 2025

Filed:

Mar. 18, 2020
Applicant:

Nippon Telegraph and Telephone Corporation, Tokyo, JP;

Inventors:

Daiki Kobayashi, Tokyo, JP;

Kazuaki Watanabe, Tokyo, JP;

Masafumi Nakagawa, Tokyo, JP;

Atsushi Aratake, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 1/22 (2006.01); G01B 7/16 (2006.01); G01L 5/10 (2020.01); G01L 5/102 (2020.01); G01M 5/00 (2006.01); F16L 11/118 (2006.01); H02G 3/04 (2006.01);
U.S. Cl.
CPC ...
G01L 1/2287 (2013.01); G01B 7/16 (2013.01); G01L 5/10 (2013.01); G01L 5/102 (2013.01); G01M 5/0058 (2013.01); F16L 11/118 (2013.01); G01M 5/0025 (2013.01); H02G 3/0468 (2013.01);
Abstract

A strain measuring device () is a strain measuring device () for measuring strain on an FEP (), and includes a viscous body () that has a lower rigidity than the FEP () and covers an uneven surface of the FEP (), and a strain gauge () that is attached to a portion of a surface of the viscous body ().


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