Sagamiham, Japan

Daiju Nakanao

This inventor holds 1 USPTO granted patent. Top assignee: International Business Machines Corporation. Active years: 2007.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Daiju Nakanao. Retrieved from https://idiyas.com/inventor/daiju-nakanao

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: Daiju Nakanao: Innovator in TFT Inspection Technology

Introduction

Daiju Nakanao is a prominent inventor based in Sagamihara, Japan. He has made significant contributions to the field of technology, particularly in the inspection of thin film transistors (TFTs). His innovative work has led to the development of a specialized inspection device that enhances the quality and reliability of TFTs used in various applications.

Latest Patents

Daiju Nakanao holds a patent for an inspection device designed for inspecting TFTs. This device is engineered to supply a current to a light-emitting element, ensuring accurate assessments of the transistors. The inspection device features a first current supply circuit that provides a drain current between the drain and source of the TFT. Additionally, it includes a gate voltage adjustment circuit that modifies the gate voltage applied to the TFT's gate, allowing a predetermined specified current to flow between the drain and source. A measurement unit is also incorporated to measure the adjusted gate voltage, ensuring precise inspection results. He has 1 patent to his name.

Career Highlights

Daiju Nakanao is currently employed at International Business Machines Corporation, commonly known as IBM. His role at IBM allows him to collaborate with other talented professionals in the field of technology. His work focuses on advancing inspection technologies that are crucial for the performance of electronic devices.

Collaborations

Throughout his career, Nakanao has worked alongside notable colleagues, including Yoshinori Mekata and Kenichi Imura. These collaborations have fostered an environment of innovation and creativity, leading to advancements in their respective fields.

Conclusion

Daiju Nakanao's contributions to the field of TFT inspection technology exemplify his dedication to innovation. His patent for an inspection device showcases his ability to address complex challenges in electronics. Through his work at IBM and collaborations with esteemed colleagues, Nakanao continues to influence the landscape of technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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