The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2007
Filed:
Oct. 21, 2004
Yoshitami Sakaguchi, Hadano, JP;
Daiju Nakanao, Sagamiham, JP;
Kenichi Imura, Shiga-ken, JP;
Yoshinori Mekata, Moriyama, JP;
Tomoyuki Taguchi, Kusatsu, JP;
Yoshitami Sakaguchi, Hadano, JP;
Daiju Nakanao, Sagamiham, JP;
Kenichi Imura, Shiga-ken, JP;
Yoshinori Mekata, Moriyama, JP;
Tomoyuki Taguchi, Kusatsu, JP;
International Business Machines Corporation, Armonk, NY (US);
Abstract
Provided is an inspection device which inspects a thin film transistor (TFT) for supplying a current to a light emitting element. The inspection device includes: a first current supply circuit which supplies a drain current between a drain and a source of the TFT; a gate voltage adjustment circuit which adjust a gate voltage to be applied to a gate of the TFT so as to allow a predetermined specified current to flow between the drain and source of the TFT; and a measurement unit which measures the gate voltage adjusted by the gate voltage adjustment circuit.