Dai-Jin Yeh

Title: The Innovative Contributions of Dai-Jin Yeh

Introduction

Dai-Jin Yeh is a notable inventor based in Hsinchu County, Taiwan. He has made significant contributions to the field of technology, particularly in the area of wafer testing. His innovative approach has led to the development of a unique patent that enhances the efficiency of testing semiconductor wafers.

Latest Patents

Dai-Jin Yeh holds a patent for a wafer testing probe card. This invention includes a printed circuit board, a flexible circuit board, an elastic piece, and a probe unit. The flexible circuit board is electrically connected to the printed circuit board, while the elastic piece is positioned between the two boards. The probe unit consists of a probe head and multiple probes, with the probe head fixed on the printed circuit board and featuring several through holes. The probes pass through these holes and can move up and down relative to the probe head, allowing for precise testing of semiconductor wafers.

Career Highlights

Dai-Jin Yeh is currently employed at Mpi Corporation, where he continues to innovate and contribute to advancements in technology. His work at Mpi Corporation has positioned him as a key player in the semiconductor testing industry.

Collaborations

Dai-Jin Yeh collaborates with talented individuals such as Ming-Chi Chen and Tien-Chia Li. These partnerships enhance the creative process and lead to further innovations in their respective fields.

Conclusion

Dai-Jin Yeh's contributions to wafer testing technology exemplify the spirit of innovation. His patent for the wafer testing probe card showcases his ability to solve complex problems in the semiconductor industry. Through his work at Mpi Corporation and collaborations with skilled colleagues, he continues to make a significant impact in the field.